Product Summary
IC, SCAN TEST DEVICE, TSSOP-56 Logic Type: Scan Test Device Logic Case Style: TSSOP No. of Pins: 56 Supply Voltage Range: 4.5V to 5.5V Operating Temperature Range: -40°C to +85°C Family Type: ABT Input Type: TTL RoHS Compliant: Yes
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![]() 74ABT18245ADGGRG4 |
![]() Texas Instruments |
![]() Specialty Function Logic Scan Test Devices |
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![]() 74ABT00 |
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![]() Negotiable |
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![]() 74ABT00D,112 |
![]() NXP Semiconductors |
![]() Gates (AND / NAND / OR / NOR) QUAD 2-IN NAND GATE |
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![]() 74ABT00D,118 |
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![]() IC 2-IN GATE NAND QUAD 14SOIC |
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![]() 74ABT00DB,112 |
![]() NXP Semiconductors |
![]() Gates (AND / NAND / OR / NOR) QUAD 2-INPUT NAND |
![]() Data Sheet |
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![]() 74ABT00DB,118 |
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![]() IC 2-IN GATE NAND QUAD 14-SSOP |
![]() Data Sheet |
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![]() 74ABT00N,112 |
![]() NXP Semiconductors |
![]() Gates (AND / NAND / OR / NOR) QUAD 2-INPUT NAND |
![]() Data Sheet |
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