Product Summary

IC, SCAN TEST DEVICE, LQFP-64 Logic Type: Scan Test Device Logic Case Style: LQFP No. of Pins: 64 Supply Voltage Range: 4.5V to 5.5V Operating Temperature Range: -40°C to +85°C Family Type: ABT Input Type: TTL RoHS Compliant: Yes

Image Part No Mfg Description Data Sheet Download Pricing
(USD)
Quantity
74ABTH182652APMG4
74ABTH182652APMG4

Texas Instruments

Specialty Function Logic Scan Test Devices

Data Sheet

0-116: $8.42
116-250: $7.76
250-500: $7.58
Image Part No Mfg Description Data Sheet Download Pricing
(USD)
Quantity
74ABT00
74ABT00

Other


Data Sheet

Negotiable 
74ABT00D,112
74ABT00D,112

NXP Semiconductors

Gates (AND / NAND / OR / NOR) QUAD 2-IN NAND GATE

Data Sheet

0-1: $0.26
1-25: $0.24
25-100: $0.23
100-250: $0.22
74ABT00D,118
74ABT00D,118


IC 2-IN GATE NAND QUAD 14SOIC

Data Sheet

0-2500: $0.22
74ABT00DB,112
74ABT00DB,112

NXP Semiconductors

Gates (AND / NAND / OR / NOR) QUAD 2-INPUT NAND

Data Sheet

0-1: $0.55
1-25: $0.43
25-100: $0.38
100-250: $0.34
74ABT00DB,118
74ABT00DB,118


IC 2-IN GATE NAND QUAD 14-SSOP

Data Sheet

0-2000: $0.22
74ABT00N,112
74ABT00N,112

NXP Semiconductors

Gates (AND / NAND / OR / NOR) QUAD 2-INPUT NAND

Data Sheet

0-1: $0.26
1-25: $0.24
25-100: $0.23
100-250: $0.22